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  october 2008 ?2008 fairchild semiconductor corporation 1 www.fairchildsemi.com fdh50n50_f133 / fda50n50 rev. a fdh50n50_f133 / fda50n50 500v n-channel mosfet unifet tm fdh50n50_f133 / fda50n50 500v n-channel mosfet features ? 48a, 500v, r ds(on) = 0.105 @v gs = 10 v ? low gate charge ( typical 105 nc) ?low c rss ( typical 45 pf) ?fast switching ? 100% avalanche tested ? improved dv/dt capability description these n-channel enhancement mode power field effect transis - tors are produced using fairchil d? s propr ietary, planar stripe, dmos technology. this advanced technology has be en especially t a ilored to mini - mize on-state resistance, prov ide supe rior switching perfor - mance, and withstand high energy pulse in the avalanche and commut ation mode. these devices are well suited for high effi - cient switched mode power suppl ie s and active power factor correction.   { { { z z z   { { { z z z s d g g s d to-247 fdh series gs d to-3p n fda series absolute maximum ratings symbol parameter fdh50n50_f133/fda50n50 unit v dss drain-source voltage 500 v i d drain current - continuous (t c = 25 c) - continuous (t c = 100 c) 48 30.8 a a i dm drain current - pulsed (note 1) 192 a v gss gate-source voltage 20 v e as single pulsed avalanche energy (note 2) 1868 mj i ar avalanche current (note 1) 48 a e ar repetitive avalanche energy (note 1) 62.5 mj dv/dt peak diode recovery dv/dt (note 3) 4.5 v/ns p d power dissipation (t c = 25c) - derate above 25 c 625 5 w w/ c t j, t stg operating and storage temperature range -55 to +150 c t l maximum lead temperature for soldering purpose, 1/8? from case for 5 seconds 300 c thermal characteristics symbol parameter min. max. unit r jc thermal resistance, junction-to-case -- 0.2 c/w r cs thermal resistance, case-to-sink 0.24 -- c/w r ja thermal resistance, junction-to-ambient -- 40 c/w
2 www.fairchildsemi.com fdh50n50_f133 / fda50n50 rev. a fdh50n50_f133 / fda50n50 500v n-channel mosfet package marking and ordering information device marking device package reel size tape width quantity fdh50n50_f133 fdh50n50_f133 to-247 - - 30 fda50n50 fda50n50 to-3p n - - 30 electrical characteristics t c = 25c unless otherwise noted symbol parameter conditions min. typ. max units off characteristics bv dss drain-source breakdown voltage v gs = 0v, i d = 250 a 500 -- -- v bv dss / t j breakdown voltage temperature coefficient i d = 250 a, referenced to 25 c -- 0.5 -- v/ c i dss zero gate voltage drain current v ds = 500v, v gs = 0v v ds = 400v, t c = 125 c -- -- -- -- 25 250 a a i gssf gate-body leakage current, forward v gs = 20v, v ds = 0v -- -- 100 na i gssr gate-body leakage current, reverse v gs = -20v, v ds = 0v -- -- -100 na on characteristics v gs(th) gate threshold voltage v ds = v gs , i d = 250 a 3.0 -- 5.0 v r ds(on) static drain-source on-resistance v gs = 10v, i d = 24a -- 0.089 0.105 g fs forward transconductance v ds = 40v, i d = 48a (note 4) -- 20 -- s dynamic characteristics c iss input capacitance v ds = 25v, v gs = 0v, f = 1.0mhz -- 4979 6460 pf c oss output capacitance -- 760 1000 pf c rss reverse transfer capacitance -- 50 65 pf c oss output capacitance v ds = 400v, v gs = 0v, f = 1.0mhz -- 161 -- pf c oss eff. effective output capacitance v ds = 0v to 400v, v gs = 0v -- 342 -- pf switching characteristics t d(on) turn-on delay time v dd = 250v, i d = 48a r g = 25 (note 4, 5) -- 105 220 ns t r turn-on rise time -- 360 730 ns t d(off) turn-off delay time -- 225 460 ns t f turn-off fall time -- 230 470 ns q g total gate charge v ds = 400v, i d = 48a v gs = 10v (note 4, 5) -- 105 137 nc q gs gate-source charge -- 33 -- nc q gd gate-drain charge -- 45 -- nc drain-source diode characteristics and maximum ratings i s maximum continuous drain-source diode forward current -- -- 48 a i sm maximum pulsed drain-source diode forward current -- -- 192 a v sd drain-source diode forward voltage v gs = 0v, i s = 48a -- -- 1.4 v t rr reverse recovery time v gs = 0v, i s = 48a di f /dt =100a/ s (note 4) -- 580 -- ns q rr reverse recovery charge -- 10 -- c notes: 1. repetitive rating: pulse width limit ed by maximum junction temperature 2. l = 1.46mh, i as = 48a, v dd = 50v, r g = 25 , starting t j = 25 c 3. i sd 48a, di/dt 200a/ s, v dd bv dss , starting t j = 25 c 4. pulse test: pulse width 300 s, duty cycle 2% 5. essentially independent of operating temperature typical characteristics
3 www.fairchildsemi.com fdh50n50_f133 / fda50n50 rev. a fdh50n50_f133 / fda50n50 500v n-channel mosfet typical performance characteristics figure 1. on-region characteristics figure 2. transfer characteristics 10 -1 10 0 10 1 10 -1 10 0 10 1 10 2 v gs top : 15.0 v 10.0 v 8.0 v 7.0 v 6.5 v 6.0 v bottom : 5.5 v notes : 1. 250 s pulse test 2. t c = 25 o c i d , drain current [a] v ds , drain-source voltage [v] 4567891 0 0.1 1 10 100 notes : 1. v ds = 40v 2. 250 s pulse test -55 o c 150 o c 25 o c i d , drain current [a] v gs , gate-source voltage [v] figure 3. on-resistance variation vs. figure 4. body diode forward voltage drain current and gate voltage v ariati on vs. s ourc e current and temperatue 0 25 50 75 100 125 150 175 0.0 0.1 0.2 0.3 0.4 v gs = 20v v gs = 10v note : t j = 25 o c r ds(on) [ ], drain-source on-resistance i d , drain current [a] 0.20.40.60.81.01.21.41.6 0 40 80 120 160 25 o c 150 o c notes : 1. v gs = 0v 2. 250 s pulse test i dr , reverse drain current [a] v sd , source-drain voltage [v] figure 5. capacitance characteristics figure 6. gate charge characteristics 10 -1 10 0 10 1 10 2 0 2,000 4,000 6,000 8,000 10,000 12,000 c iss = c gs + c gd (c ds = shorted) c oss = c ds + c gd c rss = c gd notes : 1. v gs = 0 v 2. f = 1 mhz c rss c oss c iss capacitance [pf] v ds , drain-source voltage [v] 0 20 40 60 80 100 120 0 2 4 6 8 10 12 v ds = 250v v ds = 100v v ds = 400v note : i d = 48a v gs , gate-source voltage [v] q g , total gate charge [nc]
4 www.fairchildsemi.com fdh50n50_f133 / fda50n50 rev. a fdh50n50_f133 / fda50n50 500v n-channel mosfet typical performance characteristics (continued) figure 7. breakdown voltage variation f igure 8. on-resistance variation vs. temperature vs. temperature -100 -50 0 50 100 150 200 0.8 0.9 1.0 1.1 1.2 notes : 1. v gs = 0 v 2. i d = 250 a bv dss , (normalized) drain-source breakdown voltage t j , junction temperature [ o c] -100 -50 0 50 100 150 200 0.0 0.5 1.0 1.5 2.0 2.5 notes : 1. v gs = 10 v 2. i d = 24 a r ds(on) , (normalized) drain-source on-resistance t j , junction temperature [ o c] figure 9. maximum safe operating area figure 10. maximum drain current vs. case temperature 10 0 10 1 10 2 10 3 10 -1 10 0 10 1 10 2 10 3 10 us dc 10 ms 1 ms 100 us operation in this area is limited by r ds(on) notes : 1. t c = 25 o c 2. t j = 150 o c 3. single pulse i d , drain current [a] v ds , drain-source voltage [v] 25 50 75 100 125 150 0 10 20 30 40 50 i d , drain current [a] t c , case temperature [ o c] figure 11. typical drain current slope figure 12. typical drain-source voltage vs. gate resistance slope vs. gate resistance 0 5 10 15 20 25 30 35 40 45 50 0 5 10 15 20 25 30 35 40 45 notes : 1. v ds = 400 v 2. v gs = 12 v 3. i d = 25a 4. t j = 125 o c dv/dt(off) dv/dt(on) dv/dt [v/ns] r g , gate resistance [ ] 0 5 10 15 20 25 30 35 40 45 50 0 500 1,000 1,500 2,000 2,500 3,000 3,500 4,000 notes : 1. v ds = 400 v 2. v gs = 12 v 3. i d = 25a 4. t j = 125 o c di/dt(off) di/dt(on) di/dt [a/ s] r g , gate resistance [ ]
5 www.fairchildsemi.com fdh50n50_f133 / fda50n50 rev. a fdh50n50_f133 / fda50n50 500v n-channel mosfet typical performance characteristics (continued) figure 13. typical switching losses vs. figure 14. unclamped inductive switching gate resistance capability 0 5 10 15 20 25 30 35 40 45 50 0 200 400 600 800 1,000 notes : 1. v ds = 400 v 2. v gs = 12 v 3. i d = 25a 4. t j = 125 o c  eoff eon energy [ j] r g , gate resistance [ ] 0.01 0.1 1 10 100 1 10 100 starting t j = 150 o c notes : 1. if r = 0 t av = (l)(i as )/(1.3 rated bv dss - v dd ) 2. if r 0 t av = (l/r)in[(i as x r)/(1.3 rated bv dss - v dd )+1] starting t j = 25 o c i as , avalanche current [a] t av , time in avalanche [ms] figure 15. transient thermal resistance curve 10 -5 10 -4 10 -3 10 -2 10 -1 10 0 10 1 10 -3 10 -2 10 -1 notes : 1. z jc (t) = 0.2 o c/w max. 2. duty factor, d=t 1 /t 2 3. t jm - t c = p dm * z jc (t) single pulse d=0.5 0.02 0.2 0.05 0.1 0.01 z jc (t), thermal response t 1 , square w ave pulse duration [sec]
6 www.fairchildsemi.com fdh50n50_f133 / fda50n50 rev. a fdh50n50_f133 / fda50n50 500v n-channel mosfet mechanical dimensions to-247ab dimensions in millimeters
7 www.fairchildsemi.com fdh50n50_f133 / fda50n50 rev. a fdh50n50_f133 / fda50n50 500v n-channel mosfet mechanical dimensions dimensions in millimet ers to- 3p n
8 www.fairchildsemi.com fdh50n50_f133 / fda50n50 rev. a fdh50n50_f133 / fda50n50 500v n-channel mosfet rev. i37 trademarks the following includes registered and unregistered trademarks and service marks, owned by fairchild semiconductor and/or its gl obal subsidiaries, and is not intended to be an exhaustive list of all such trademarks. * ezswitch? and flashwriter ? are trademarks of system general corporation, used under license by fairchild semiconductor. disclaimer fairchild semiconductor reserves the right to make changes without further notice to any products herein to improve reliability, function, or design. fairchild does not assume an y liability arising out of the application or use of any product or circuit described herein; neither does it convey an y license under its patent rights, nor the rights of others. these specifications do not expand the terms of fairchild?s worldwide terms and conditions, specifically the warranty therein, which covers these products. life support policy fairchild?s products are not authorized for use as critical components in life support d evices or systems without the express written approval of fai rchild semiconductor corporation. as used herein: 1. life support devices or systems are devices or systems which, (a) are intended for surgical implant into the body or (b) support or sustain life, and (c) whose failure to perform when properly used in accordance with instructions for use provided in the labeling, can be reasonably expected to result in a significant injury of the user. 2. a critical component in any component of a life support, device, or system whose failure to perform ca n be reasonably expected to cause the failure of the life support device or system, or to affect its safety or effectiveness. product status definitions definition of terms build it now? coreplus? corepower? crossvolt ? ctl? current transfer logic? ecospark ? efficentmax? ezswitch? * ? fairchild ? fairchild semiconductor ? fact quiet series? fact ? fast ? fastvcore? flashwriter ? * fps? f-pfs? frfet ? global power resource sm green fps? green fps? e-series? gto? intellimax? isoplanar? megabuck? microcoupler? microfet? micropak? millerdrive? motionmax? motion-spm? optologic ? optoplanar ? ? pdp spm? power-spm? powertrench ? powerxs? programmable active droop? qfet ? qs? quiet series? rapidconfigure? ? saving our world, 1mw /w /kw at a time? smartmax? smart start? spm ? stealth? superfet? supersot?-3 supersot?-6 supersot?-8 supremos? syncfet? ? the power franchise ? tinyboost? tinybuck? tinylogic ? tinyopto? tinypower? tinypwm? tinywire? serdes? uhc ? ultra frfet? unifet? vcx? visualmax? xs? tm ? tm tm datasheet identification product status definition advance information formative / in design datasheet contains the design specifications for product development. specifications may change in any manner without notice. preliminary first production datasheet contains preliminary data; supplementary data will be published at a later date. fairchild semiconductor reserves the ri ght to make changes at any time without notice to improve design. no identification needed full production datasheet contains final specifications. fair child semiconductor reserves the right to make changes at any time withou t notice to improve the design. obsolete not in production datasheet contains specifications on a product that is discontinued by fairchild semiconductor. the datasheet is for reference information only. anti-counterfeiting policy fairchild semiconductor corporation?s anti-counterfeiting policy. farichild?s anti-counterfeiting policy is also stated on our external website, www.fairchildsemi.com, under sales support . counterfeiting of semiconductor parts is a growing problem in t he industry. all manufactures of semiconductor products are expe riencing counterfeiting of their parts. customers who inadvertently purchase counterfeit parts ex perience many problems such as loss of brand reputation, substa ndard performance, failed application, and increased cost of production and manufacturing de lays. fairchild is taking strong measures to protect ourselve s and our customers from the proliferation of counterfeit parts. farichild strongly encourages customers to purchase farichild parts either directly from fa irchild or from authorized fairchild distributors who are listed by country on our web page cited above. products customers buy either from fairchild directly or fr om authorized fairchild distributors are genuine parts, have full traceability, meet fairchild?s quality standards for handing and storage and provide access to farichild?s full range of up-to-date technical and product information. fairchild and our authorized distributors will stand behind all warranties and wi ll appropriately address and warranty issues that may arise. fairchild will not provide any warranty coverage or other assistance for parts bought from unau thorized sources. farichild is committed to combat this global problem and encourage our customer s to do their part in stopping this practice by buying direct or from authorized distributors.


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